TRANSIENT SENSITIVITY COMPUTATION FOR MOSFET CIRCUITS

被引：35
|
作者：
HOCEVAR, DE
YANG, P
TRICK, TN
EPLER, BD
机构：
[1] TEXAS INSTRUMENTS INC,CENT RES LAB,DALLAS,TX 75265
[2] TEXAS INSTRUMENTS INC,SPICE2 CIRCUIT ANAL PROGRAM,DALLAS,TX 75265
[3] UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
[4] UNIV ILLINOIS,DEPT ELECT & COMP ENGN,URBANA,IL 61801
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1985年 / 4卷 / 04期
关键词：
D O I：
10.1109/TCAD.1985.1270161
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：609 / 620
页数：12
相关论文
共 50 条
  • [1] TRANSIENT SENSITIVITY COMPUTATION FOR MOSFET CIRCUITS
    HOCEVAR, DE
    YANG, P
    TRICK, TN
    EPLER, BD
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (10) : 2165 - 2176
  • [2] RELAXATION-BASED TRANSIENT SENSITIVITY COMPUTATIONS FOR MOSFET CIRCUITS
    CHEN, CJ
    FENG, WS
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1995, 14 (02) : 173 - 185
  • [3] TRANSIENT ANALYSIS AND SENSITIVITY COMPUTATION IN PIECEWISE-LINEAR CIRCUITS
    ELCHERIF, Y
    LIN, PM
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1991, 38 (12): : 1525 - 1533
  • [4] Transient sensitivity computation in circuit simulation
    Daldoss, L
    Gubian, P
    Quarantelli, M
    ISCAS '99: PROCEEDINGS OF THE 1999 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 6: CIRCUITS ANALYSIS, DESIGN METHODS, AND APPLICATIONS, 1999, : 302 - 305
  • [5] Leakage and leakage sensitivity computation for combinational circuits
    Acar, E
    Devgan, A
    Rao, R
    Liu, Y
    Su, HH
    Nassif, S
    Burns, J
    ISLPED'03: PROCEEDINGS OF THE 2003 INTERNATIONAL SYMPOSIUM ON LOW POWER ELECTRONICS AND DESIGN, 2003, : 96 - 99
  • [6] Leakage and Leakage Sensitivity Computation for Combinational Circuits
    Acar, Emrah
    Devgan, Anirudh
    Nassif, Sani R.
    JOURNAL OF LOW POWER ELECTRONICS, 2005, 1 (02) : 172 - 181
  • [7] Transient Sensitivity Computations for Large-scale MOSFET Circuits Using Iterated Timing Analysis and Adaptive Direct Approach
    Chen, Chun-Jung
    2010 THE 3RD INTERNATIONAL CONFERENCE ON COMPUTATIONAL INTELLIGENCE AND INDUSTRIAL APPLICATION (PACIIA2010), VOL III, 2010, : 444 - 447
  • [8] Asynchronous circuits transient faults sensitivity evaluation
    Monnet, Y
    Renaudin, M
    Leveugle, R
    42ND DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2005, 2005, : 863 - 868
  • [9] COMPUTATION OF SENSITIVITY FUNCTIONS FOR DIGITAL CIRCUITS OF ARBITRARY STRUCTURE
    KONDRATYUK, VA
    PODLADCHIKOV, VN
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOELEKTRONIKA, 1989, 32 (12): : 75 - 76
  • [10] Sensitivity Analysis of Behavioral MOSFET Models in Transient EMC Simulation
    Hillenbrand, P.
    Beltle, M.
    Tenbohlen, S.
    Moench, S.
    2017 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE, 2017,
12345