LINEWIDTHS AND LINESTRENGTHS IN THE NU-2 BAND OF HTO AS MEASURED WITH A TUNABLE DIODE-LASER

被引:3
作者
CHERRIER, PP [1 ]
BECKWITH, PH [1 ]
REID, J [1 ]
机构
[1] MCMASTER UNIV,DEPT ENGN PHYS,HAMILTON L8S 4M1,ONTARIO,CANADA
关键词
D O I
10.1016/0022-2852(87)90171-8
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
引用
收藏
页码:69 / 74
页数:6
相关论文
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