LOW-TEMPERATURE APPARATUS FOR SINGLE-CRYSTAL DIFFRACTOMETRY - UNIT-CELL DIMENSIONS OF ALPHA-QUARTZ IN TEMPERATURE-RANGE 86-298 K

被引：42

作者：

DANIELSSON, S

GRENTHE, I

OSKARSSON, A

机构：

[1] UNIV LUND,CHEM CTR,DEPT INORG CHEM,POB 740,S-22007 LUND,SWEDEN

[2] UNIV LUND,CHEM CTR,DIV PHYS CHEM 1,POB 740,S-22007 LUND,SWEDEN

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1976年 / 9卷 / FEB1期

关键词：

D O I：

10.1107/S0021889876010418

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：14 / 17

页数：4

共 9 条

[1] PRECISION LATTICE CONSTANT DETERMINATION [J].

BOND, WL .

ACTA CRYSTALLOGRAPHICA, 1960, 13 (10) :814-818

[2] LOW-TEMPERATURE X-RAY SYSTEM FOR MATERIALS OF HIGH CHEMICAL REACTIVITY, HIGH VAPOR-PRESSURE, OR LOW MELTING-POINT [J].

BURBANK, RD .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (DEC1) :437-441

[3] A SIMPLE COLD GAS FLOW APPARATUS [J].

FRENZ, BA ;

ENEMARK, JH ;

SCHROEDE.LW ;

HODGSON, DJ ;

ROBINSON, WT ;

LOYD, RJ ;

IBERS, JA .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :112-&

[4]

KLEWE B, 1973, 8 P DET NORD STRUKT

[5]

POST B, 1964, LOW TEMPERATURE XRAY

[6] PRECISION LATTICE-PARAMETERS AND COEFFICIENTS OF THERMAL-EXPANSION OF HEXAGONAL GERMANIUM DIOXIDE [J].

RAO, KVK ;

NAIDU, SVN ;

IYENGAR, L .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (APR1) :136-138

[7] AN AUTOMATIC LOW-TEMPERATURE APPARATUS FOR SINGLE CRYSTAL DIFFRACTOMETRY [J].

RUDMAN, R ;

GODEL, JB .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :109-&

[8] THERMAL EXPANSION OF SILICA AT LOW TEMPERATURES [J].

WHITE, GK .

CRYOGENICS, 1964, 4 (01) :2-&

[9]

1962, INT TABLES XRAY CRYS, V3

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