CALCULATION OF RHEED INTENSITIES BY A THEED ALGORITHM

被引：4

作者：

ANSTIS, GR

GAN, XS

机构：

[1] Department of Applied Physics, University of Technology, Sydney, Broadway, NSW 2007

来源：

SURFACE SCIENCE | 1994年 / 314卷 / 03期

关键词：

D O I：

10.1016/0039-6028(94)90228-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

RHEED intensities from Si(111)1 x 1 are calculated using the Cowley-Moodie algorithm developed for transmission electron diffraction. The intensities are close to those calculated by the standard algorithms employed in RHEED. The Cowley-Moodie algorithm may be the best means of calculating RHEED patterns from surfaces with long periods such as Si(111)7 x 7 or from disordered surfaces.

引用

页码：L919 / L924

页数：6

共 24 条

[21] A GENERAL MATRIX REPRESENTATION OF THE DYNAMIC THEORY OF ELECTRON-DIFFRACTION .2. APPLICATION TO RHEED FROM RELAXED AND RECONSTRUCTED SURFACES [J].