CALCULATION OF RHEED INTENSITIES BY A THEED ALGORITHM

被引:4
作者
ANSTIS, GR
GAN, XS
机构
[1] Department of Applied Physics, University of Technology, Sydney, Broadway, NSW 2007
关键词
D O I
10.1016/0039-6028(94)90228-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
RHEED intensities from Si(111)1 x 1 are calculated using the Cowley-Moodie algorithm developed for transmission electron diffraction. The intensities are close to those calculated by the standard algorithms employed in RHEED. The Cowley-Moodie algorithm may be the best means of calculating RHEED patterns from surfaces with long periods such as Si(111)7 x 7 or from disordered surfaces.
引用
收藏
页码:L919 / L924
页数:6
相关论文
共 24 条
[1]  
ANSTIS GR, 1989, COMPUTER SIMULATION OF ELECTRON MICROSCOPE DIFFRACTION AND IMAGES, P229
[2]  
COLLELA R, 1972, ACTA CRYSTALLOGR A, V28, P11
[3]   THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH [J].
COWLEY, JM ;
MOODIE, AF .
ACTA CRYSTALLOGRAPHICA, 1957, 10 (10) :609-619
[4]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[5]   APPROXIMATIONS OF DYNAMICAL THEORY OF DIFFRACTION CONTRAST [J].
HOWIE, A ;
BASINSKI, ZS .
PHILOSOPHICAL MAGAZINE, 1968, 17 (149) :1039-&
[6]   CORRECTION [J].
ICHIMIYA, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (10) :1365-1365
[7]   MANY-BEAM CALCULATION OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) INTENSITIES BY THE MULTI-SLICE METHOD [J].
ICHIMIYA, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (01) :176-180
[8]   NUMERICAL CONVERGENCE OF DYNAMIC CALCULATIONS OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITIES [J].
ICHIMIYA, A .
SURFACE SCIENCE, 1990, 235 (01) :75-83
[9]  
ICHIMIYA A, 1985, JPN J APPL PHYS, V24, P1575
[10]   COMPARISON OF RHEED DYNAMICAL CALCULATION METHODS [J].
KAWAMURA, T ;
ICHIMIYA, A ;
MAKSYM, PA .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (06) :1098-1099