FIELD-ION MICROSCOPE STUDY OF ADSORPTION OF METHANE ON IRIDIUM

被引：0
作者：
JOHNSON, HR [1 ]
MORGAN, R [1 ]
机构：
[1] NEW UNIV ULSTER,COLERAINE,NORTH IRELAND
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1974年
关键词：
D O I：
暂无
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：51 / 54
页数：4
相关论文
共 50 条
[31]   A FIELD-ION MICROSCOPE STUDY OF GRAIN BOUNDARIES IN IRON [J].
MORGAN, R ;
RALPH, B .
ACTA METALLURGICA, 1967, 15 (02) :341-&
[32]   FIELD-ION MICROSCOPE FOR STUDY OF ALUMINUM-ALLOYS [J].
ZINGG, W .
HELVETICA PHYSICA ACTA, 1977, 50 (05) :656-656
[33]   A COMBINED FIELD ELECTRON AND FIELD-ION MICROSCOPE [J].
ERNST, N ;
EHRLICH, G .
JOURNAL DE PHYSIQUE, 1984, 45 (NC9) :293-296
[34]   RESOLUTION AND CONTRAST IN THE FIELD-ION MICROSCOPE [J].
KINGHAM, DR ;
HOMEIER, HHH ;
DECASTILHO, CMC .
SURFACE SCIENCE, 1985, 152 (APR) :55-62
[35]   OBSERVATION OF SI IN FIELD-ION MICROSCOPE [J].
ISHII, S ;
MANABE, S ;
HANAWA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, :63-66
[36]   OBSERVATION OF SI IN FIELD-ION MICROSCOPE [J].
BLOCK, JH ;
ERNST, L ;
ERNST, N .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 (11) :1813-1814
[37]   FRACTURE OF FIELD-ION MICROSCOPE SPECIMENS [J].
WILKES, TJ ;
TITCHMAR.JM ;
SMITH, GDW ;
SMITH, DA ;
MORRIS, RF ;
JOHNSTON, S ;
GODFREY, TJ ;
BIRDSEYE, P .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (12) :2226-&
[38]   FIELD PENETRATION INTO SEMICONDUCTORS IN THE FIELD-ION MICROSCOPE [J].
ERNST, L .
SURFACE SCIENCE, 1979, 85 (02) :302-308
[39]   MAGNIFYING SCOPE OF FIELD-ION MICROSCOPE [J].
WOODYARD, D .
ENGINEERING, 1970, 210 (5448) :378-&
[40]   ON PHOTOGRAPHY OF FIELD-ION MICROSCOPE IMAGES [J].
BOYES, ED ;
ELVIN, CD .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (03) :223-&
12345