A STUDY OF MULTIPLE-SCATTERING BACKGROUND IN COMPTON SCATTER IMAGING

被引：19

作者：

BARNEA, G ^{[1
]}

DICK, CE ^{[1
]}

GINZBURG, A ^{[1
]}

NAVON, E ^{[1
]}

SELTZER, SM ^{[1
]}

机构：

[1] NATL INST STAND & TECHNOL,PHYS LAB,GAITHERSBURG,MD 20899

来源：

NDT & E INTERNATIONAL | 1995年 / 28卷 / 03期

关键词：

COMPTON SCATTER IMAGING; MULTIPLE SCATTER; MONTE CARLO SIMULATION;

D O I：

10.1016/0963-8695(95)00002-F

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The multiple scattering background in Compton scatter imaging at 662 keV is studied, both experimentally and by Monte Carlo radiation transport calculations, as a function of the scattering angle, scattering material (aluminium, brass and tin) and object thickness. A double-peak structure was observed in the pulse-height distribution for the thicker brass and tin objects and at the larger scattering angles (90 degrees and 120 degrees). In addition to the Compton peak, a second peak appeared at a higher energy. Monte Carlo transport simulations have revealed the origin of the second peak: photons that have scattered exactly twice before reaching the detector. The ratio of the multiple-scattered radiation to the total radiation detected was calculated as a function of the energy-window width around the Compton peak and scattering angle. The results of this study may help in the design of future Compton scatter imaging apparatus.

引用

页码：155 / 162

页数：8

共 17 条

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