COMBINED AES, LEED, SEM AND TEM CHARACTERIZATIONS OF CU-SI(100) INTERFACES

被引：29
作者：
HANBUCKEN, M
METOIS, JJ
MATHIEZ, P
SALVAN, F
机构：
[1] UNIV AIX MARSEILLE 1,UER PHYS,F-13331 MARSEILLE 3,FRANCE
[2] FAC SCI LUMINY,DEPT PHYS,CNRS,UA 783,CASE 901,F-13288 MARSEILLE 9,FRANCE
来源：
SURFACE SCIENCE | 1985年 / 162卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(85)90957-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：622 / 627
页数：6
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