SPUTTERING TECHNIQUES, ESPECIALLY SECONDARY ION MASS-SPECTROMETRY

被引：0
作者：
BENNINGHOVEN, A [1 ]
机构：
[1] UNIV MUNSTER,INST PHYS,D-4400 MUNSTER,FED REP GER
来源：
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1984年 / 317卷 / 06期
关键词：
D O I：
10.1007/BF00593798
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：632 / 633
页数：2
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[3]   SECONDARY ION MASS-SPECTROMETRY - NEW ANALYTICAL TECHNIQUE FOR BIOLOGICALLY IMPORTANT COMPOUNDS [J].
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[4]  
BENNINGHOVEN A, ORG MASS SPECTROM
[5]  
STEFFENS P, 1983, SPRINGER SERIES CHEM, V25, P111
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