TUNGSTEN AS A MARKER IN THIN-FILM DIFFUSION STUDIES

被引：45
作者：
VANGURP, GJ
SIGURD, D
VANDERWEG, WF
机构：
[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
[2] RES INST PHYS,STOCKHOLM,SWEDEN
[3] PHILIPS RES LABS,AMSTERDAM,NETHERLANDS
来源：
APPLIED PHYSICS LETTERS | 1976年 / 29卷 / 03期
关键词：
D O I：
10.1063/1.89007
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：159 / 161
页数：3
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