A HIGH-RESOLUTION X-RAY DIAGNOSTIC-TECHNIQUE USING SIMULTANEOUS DIFFRACTION FROM SEVERAL PLANES OF ACID PHTHALATE CRYSTALS

被引：18

作者：

BURKHALTER, PG ^{[1
]}

BROWN, DB ^{[1
]}

GERSTEN, M ^{[1
]}

机构：

[1] MAXWELL LABS INC,SAN DIEGO,CA 92123

来源：

JOURNAL OF APPLIED PHYSICS | 1981年 / 52卷 / 07期

关键词：

D O I：

10.1063/1.329363

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4379 / 4386

页数：8

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