CHARACTERISTIC VOLTAGE OF PROGRAMMED METAL-TO-METAL ANTIFUSES

被引：16

作者：

ZHANG, G

HU, C

YU, P

CHIANG, S

HAMDY, E

机构：

[1] ACTEL CORP,SUNNYVALE,CA 94086

[2] UNIV CALIF BERKELEY,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720

来源：

IEEE ELECTRON DEVICE LETTERS | 1994年 / 15卷 / 05期

关键词：

D O I：

10.1109/55.291598

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The characteristic voltage V(f) of different programmed metal-to-metal antifuses was measured and found to be nearly independent of the electrode materials. An electrothermal model, used previously to predict programmed silicon-electrode antifuse resistance, was extended to explain the above phenomenon. The metal-to-metal antifuse resistance vs. the programming current is governed by the Wiedeman-Franz Law.

引用

页码：166 / 168

页数：3

共 9 条

[1]

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[2]

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[5]

HU C, 1992, IEEE IEDM, P591

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