ULTRA-LOW PRESSURE CHEMICAL VAPOR-DEPOSITION OF POLYCRYSTALLINE AND AMORPHOUS-SILICON

被引:5
|
作者
AHMED, W
MEAKIN, DB
STOEMENOS, J
ECONOMOU, NA
PILKINGTON, RD
机构
[1] GEC RES LABS,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND
[2] ARISTOTELES UNIV THESSALONIKA,SALONIKA,GREECE
[3] UNIV SALFORD,SALFORD M5 4WT,LANCS,ENGLAND
关键词
D O I
10.1007/BF00543941
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The deposition of undoped polycrystalline and amorphous silicon in an ultra-low pressure chemical vapour deposition system capable of achieving operating pressure of 0.03 Pa is discussed. It is found that at deposition temperatures in the region of 630-degrees-C and reactor pressures of less than 1.3 Pa very large grained polycrystalline silicon films are obtained, and in this regime the growth rate is independent of the reactor pressure. Excellent uniformity is obtained and the process can be easily scaled up for large substrates and high volume batch production.
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页码:479 / 484
页数:6
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