ARSENIC-TERMINATED SILICON AND GERMANIUM SURFACES STUDIED BY SCANNING TUNNELLING MICROSCOPY

被引：100

作者：

BECKER, RS

KLITSNER, T

VICKERS, JS

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01374.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：157 / 165

页数：9

共 25 条

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