PHOTOTHERMAL DEFLECTION DENSITOMETER FOR THIN-LAYER CHROMATOGRAPHY

被引：34

作者：

CHEN, TI ^{[1
]}

MORRIS, MD ^{[1
]}

机构：

[1] UNIV MICHIGAN,DEPT CHEM,ANN ARBOR,MI 48109

来源：

ANALYTICAL CHEMISTRY | 1984年 / 56卷 / 01期

关键词：

D O I：

10.1021/ac00265a006

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

收藏

页码：19 / 21

页数：3

相关论文

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