SURFACE-ANALYSIS BY SCANNING TUNNELING MICROSCOPY

被引：0
|
作者：
BARO, AM [1 ]
机构：
[1] UNIV AUTONOMA MADRID,DEPT FIS FUNDAMENTAL,E-28049 MADRID,SPAIN
来源：
VACUUM | 1987年 / 37卷 / 5-6期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：492 / 492
页数：1
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