THE MECHANISM AND KINETICS OF THE OXIDATION OF CR(100) SINGLE-CRYSTAL SURFACES STUDIED BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION, X-RAY-EMISSION SPECTROSCOPY, AND SECONDARY ION MASS-SPECTROMETRY AUGER SPUTTER DEPTH PROFILING

被引:21
作者
ARLOW, JS
MITCHELL, DF
GRAHAM, MJ
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期
关键词
D O I
10.1116/1.574675
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
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页码:572 / 576
页数:5
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