QUANTITATIVELY MEASURED PHOTOREFRACTIVE SENSITIVITY OF PROTON-EXCHANGED LITHIUM-NIOBATE, PROTON-EXCHANGED MAGNESIUM OXIDE-DOPED LITHIUM-NIOBATE, AND ION-EXCHANGED POTASSIUM TITANYL PHOSPHATE WAVE-GUIDES

被引：14

作者：

KONDO, Y ^{[1
]}

MIYAGUCHI, S ^{[1
]}

ONOE, A ^{[1
]}

FUJII, Y ^{[1
]}

机构：

[1] PIONEER ELECTR CO LTD, CORP RES & DEV LAB, TSURUGA, SAITAMA, JAPAN

来源：

APPLIED OPTICS | 1994年 / 33卷 / 16期

关键词：

D O I：

10.1364/AO.33.003348

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The photorefractive sensitivities of proton-exchanged lithium niobate waveguides and Rb-ion-exchanged potassium titanyl phosphate waveguides are quantitatively measured, and their influence on waveguide applications is estimated.

引用

页码：3348 / 3352

页数：5

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