CELLULAR AUTOMATA CIRCUITS FOR BUILT-IN SELF-TEST

被引：27
|
作者：
HORTENSIUS, PD [1 ]
MCLEOD, RD [1 ]
PODAIMA, BW [1 ]
机构：
[1] UNIV MANITOBA,DEPT ELECT & COMP ENGN,WINNIPEG R3T 2N2,MANITOBA,CANADA
来源：
IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1990年 / 34卷 / 2-3期
关键词：
D O I：
10.1147/rd.342.0389
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
[No abstract available]
引用
收藏
页码：389 / 405
页数：17
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