HIGH-FIELD TRANSPORT OF HOT-ELECTRONS IN STRAINED SI/SIGE HETEROSTRUCTURES

被引:5
|
作者
MIYATSUJI, K
UEDA, D
MASAKI, K
YAMAKAWA, S
HAMAGUCHI, C
机构
[1] ANNAN COLL TECHNOL,ANAN,TOKUSHIMA 774,JAPAN
[2] OSAKA UNIV,DEPT ELECTR ENGN,SUITA,OSAKA 565,JAPAN
关键词
D O I
10.1088/0268-1242/9/5S/101
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Monte Carlo simulation is carried out to investigate the high-field transport properties of the two-dimensional electron gas in strained Si/SiGe heterostructures. In the simulation we take into account the intervalley scattering between twofold and fourfold valleys of an Si well layer split by the tensile strain. Intervalley scatterings within the twofold or fourfold valleys are also incorporated in the simulation as well as the acoustic phonon scattering. We obtained an electron drift velocity at room temperature as high as 1 X 10(7) cm s-1 at 10 kV cm-1. Calculated results of 4.2 and 77 K show negative differential mobility beyond 10 kV cm-1. At 77 K the transient response of the drift velocity shows a remarkable overshoot, reaching about 3 x 10(7) cm s-1 at 0.2 ps at 10 kV cm-1.
引用
收藏
页码:772 / 774
页数:3
相关论文
共 50 条
  • [1] HIGH-FIELD TRANSPORT OF HOT-ELECTRONS IN STRAINED SI/SIGE HETEROSTRUCTURE
    MIYATSUJI, K
    UEDA, D
    MASAKI, K
    YAMAKAWA, S
    HAMAGUCHI, C
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (4B): : 2378 - 2380
  • [2] HIGH-FIELD TRANSPORT OF HOT-ELECTRONS IN A SEMICONDUCTOR
    KIM, CS
    KIM, DY
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1993, 26 (04) : 343 - 348
  • [3] High field transport of hot electrons in strained Si/SiGe heterostructure
    Miyatsuji, Kazuo
    Ueda, Daisuke
    Masaki, Kazuo
    Yamakawa, Shinya
    Hamaguchi, Chihiro
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1994, 33 (4B): : 2378 - 2380
  • [4] High field transport of hot electrons in strained Si/SiGe heterostructure
    Miyatsuji, Kazuo
    Ueda, Daisuke
    Masaki, Kazuo
    Yamakawa, Shinya
    Hamaguchi, Chihiro
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1994, 33 (4 B): : 2378 - 2380
  • [5] Ultrafast high-field transport, after 10 fs hot carrier injection in Si and SiGe
    Brodschelm, A
    Schöllhorn, C
    Kasper, E
    Leitenstorfer, A
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2004, 19 (04) : S267 - S269
  • [6] Carrier transport and velocity overshoot in strained Si on SiGe heterostructures
    Ferry, DK
    Formicone, G
    Vasileska, D
    EPITAXY AND APPLICATIONS OF SI-BASED HETEROSTRUCTURES, 1998, 533 : 31 - 42
  • [7] HOT-ELECTRONS IN SEMICONDUCTOR HETEROSTRUCTURES AND SUPERLATTICES
    HESS, K
    IAFRATE, GJ
    TOPICS IN APPLIED PHYSICS, 1985, 58 : 201 - 226
  • [8] Monte Carlo study of electron transport in strained Si/SiGe heterostructures
    Rashed, M.
    Shih, W.-K.
    Jallepalli, S.
    Zaman, R.
    Kwan, T.J.T.
    Maziar, C.M.
    VLSI Design, 6 (1-4): : 213 - 216
  • [9] A Monte Carlo study of electron transport in strained Si/SiGe heterostructures
    Rashed, M
    Shih, WK
    Jallepalli, S
    Zaman, R
    Kwan, TJT
    Maziar, CM
    VLSI DESIGN, 1998, 6 (1-4) : 213 - 216
  • [10] Interdiffusion in strained Si/strained SiGe epitaxial heterostructures
    Xia, Guangrui
    Canonico, Michael
    Hoyt, Judy L.
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2007, 22 (01) : S55 - S58