TOTAL-REFLECTION X-RAY-FLUORESCENCE IN THE ULTRAMICRO ANALYSIS OF ARTISTS PIGMENTS

被引：24
作者：
MOENS, L
DEVOS, W
KLOCKENKAMPER, R
VONBOHLEN, A
机构：
[1] DORTMUND INST, PHYS ANAL RES GRP, DORTMUND, GERMANY
[2] INST SPECT & ANGEW SPECT, DORTMUND, GERMANY
[3] UNIV DORTMUND, W-4600 DORTMUND 50, GERMANY
来源：
TRAC-TRENDS IN ANALYTICAL CHEMISTRY | 1994年 / 13卷 / 05期
关键词：
D O I：
10.1016/0165-9936(94)85039-9
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
The analytical characterization of artists' pigments is very important for art history and for restoration and conservation. Total reflection X-ray fluorescence analysis makes possible the non-destructive analysis of pigments. This new approach complements existing techniques and is unique in being at the same time accurate, fast, inexpensive, and well suited to the screening of pigments used in historical works of art.
引用
收藏
页码：198 / 205
页数：8
相关论文
共 24 条
[1]   NONDESTRUCTIVE PIGMENT ANALYSIS OF ARTIFACTS BY RAMAN MICROSCOPY [J].
BEST, SP ;
CLARK, RJH ;
WITHNALL, R .
ENDEAVOUR, 1992, 16 (02) :66-73
[2]  
DUFILHO J, 1992, ANALUSIS, V20, pM15
[3]  
Feller RL., 1986, ARTISTS PIGMENTS HDB, P141
[4]  
Gettens Rutherford J., 1966, PAINTING MATERIALS S
[5]  
GIGANTE GE, 1991, ARCHAEOMETRY 90, P255
[6]  
Guineau B., 1984, STUD CONSERV, V29, P35
[7]  
HOUTMAN JP, 1965, RADIOCHEMICAL METHOD, V1, P85
[8]   TOTAL REFLECTION X-RAY-FLUORESCENCE - AN EFFICIENT METHOD FOR MICROANALYSIS, TRACE AND SURFACE-LAYER ANALYSIS [J].
KLOCKENKAMPER, R ;
VONBOHLEN, A .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1992, 7 (02) :273-279
[9]   ANALYTICAL CHARACTERIZATION OF ARTISTS PIGMENTS USED IN OLD AND MODERN PAINTINGS BY TOTAL-REFLECTION X-RAY-FLUORESCENCE [J].
KLOCKENKAMPER, R ;
VONBOHLEN, A ;
MOENS, L ;
DEVOS, W .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1993, 48 (02) :239-246
[10]   TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY [J].
KLOCKENKAMPER, R ;
KNOTH, J ;
PRANGE, A ;
SCHWENKE, H .
ANALYTICAL CHEMISTRY, 1992, 64 (23) :A1115-+
123