ELECTRONIC-STRUCTURE AND PROPERTIES OF SILICON TRANSITION-METAL INTERFACES

被引：4
|
作者：
BISI, O [1 ]
CHIAO, LW [1 ]
TU, KN [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
SURFACE SCIENCE | 1985年 / 152卷 / APR期
关键词：
D O I：
10.1016/0039-6028(85)90537-0
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：1185 / 1190
页数：6
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