EXTREMELY LOW-NOISE POTENTIOMETRY WITH A SCANNING TUNNELING MICROSCOPE

被引：48

作者：

PELZ, JP

KOCH, RH

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 03期

关键词：

D O I：

10.1063/1.1140428

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：301 / 305

页数：5

共 11 条

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[9] SCANNING TUNNELING POTENTIOMETRY [J].

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[10]

REIF F, 1965, FUNDAMENTALS STATIST

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