RANDOM-PATTERN COVERAGE ENHANCEMENT AND DIAGNOSIS FOR LSSD LOGIC SELF-TEST

被引：92
作者：
EICHELBERGER, EB
LINDBLOOM, E
机构：
来源：
IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1983年 / 27卷 / 03期
关键词：
D O I：
10.1147/rd.273.0265
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Embedded linear feedback shift registers can be used for a logic component self-test. The issue of test coverage is addressed by circuit modification, where necessary, of random-pattern-resistant fault nodes. Also given is a procedure that supports net-level diagnosis for structured logic in the presence of random test-pattern generation and signature analysis.
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页码：265 / 272
页数：8
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