PERSISTENCE OF N-BEAM DYNAMICAL EFFECTS IN HIGH-VOLTAGE ELECTRON-DIFFRACTION FROM SINGLE THIN PARAFFIN MICROCRYSTALS

被引：27

作者：

DORSET, DL ^{[1
]}

机构：

[1] MED FDN BUFFALO,MOLEC BIOPHYS DEPT,73 HIGH ST,BUFFALO,NY 14203

来源：

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.322610

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：780 / 782

页数：3

共 13 条

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[5] THE OBSERVATION OF SPIRAL GROWTH-STEPS IN NORMAL-PARAFFIN SINGLE CRYSTALS IN THE ELECTRON MICROSCOPE
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VAND, V
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1951, 206 (1087) : 555 - 562
[6] FANKHUA L, 1963, ACTA PHYS SINICA, V19, P735
[7] FUJIWARA F, 1961, J PHYS SOC JPN, V14, P1558
[8] A METHOD OF ELIMINATING THE PRIMARY EXTINCTION EFFECT IN ELECTRON DIFFRACTION
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[J]. ACTA CRYSTALLOGRAPHICA, 1957, 10 (08): : 533 - 534
[9] MATRICARDI VR, 1972, MICRON, V3, P526
[10] THE CRYSTAL STRUCTURE OF ORTHORHOMBIC HEXATRIACONTANE C36H74
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