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- [4] Characterization of Si-SiO2 interface states in MOS capacitors by using DLTS technique Proceedings of the Asia Pacific Physics Conference, 1991,
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- [8] DLTS INVESTIGATIONS OF SI-SIO2 INTERFACE STATES OF ELECTRON-BEAM IRRADIATED MOS STRUCTURES PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1983, 118 (02): : K133 - K136
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