DETERMINATION OF AUTOCORRELATION FUNCTION OF HEIGHT ON A ROUGH SURFACE FROM COHERENT-LIGHT SCATTERING

被引：44
作者：
CHANDLEY, PJ [1 ]
机构：
[1] IMPERIAL COLL,DEPT PHYS,LONDON SW7 2BZ,ENGLAND
来源：
OPTICAL AND QUANTUM ELECTRONICS | 1976年 / 8卷 / 04期
关键词：
D O I：
10.1007/BF00619546
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：329 / 333
页数：5
相关论文
共 8 条
[1]  
Beckmann P., 1963, SCATTERING ELECTROMA
[2]  
Beckmann P, 1967, PROGR OPTICS, V6, P53
[3]   RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J].
BENNETT, HE ;
PORTEUS, JO .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) :123-+
[4]   OPTICAL AND MECHANICAL RMS SURFACE ROUGHNESS COMPARISON [J].
BIRKEBAK, RC .
APPLIED OPTICS, 1971, 10 (08) :1970-&
[5]   RE-FORMULATION OF SOME RESULTS OF BECKMANN,P FOR SCATTERING FROM ROUGH SURFACES [J].
CHANDLEY, PJ ;
WELFORD, WT .
OPTICAL AND QUANTUM ELECTRONICS, 1975, 7 (05) :393-397
[6]   SURFACE-ROUGHNESS MEASUREMENTS FROM COHERENT-LIGHT SCATTERING [J].
CHANDLEY, PJ .
OPTICAL AND QUANTUM ELECTRONICS, 1976, 8 (04) :323-327
[7]   SURFACE ROUGHNESS DETERMINATION BY MEASUREMENT OF REFLECTANCE [J].
DEPEW, CA ;
WEIR, RD .
APPLIED OPTICS, 1971, 10 (04) :969-&
[8]   LIGHT-SCATTERING FROM FUSED POLYCRYSTALLINE ALUMINUM-OXIDE SURFACES [J].
HENSLER, DH .
APPLIED OPTICS, 1972, 11 (11) :2522-&
1