DISLOCATION INTERACTIONS IN SILICON BY COMBINED X-RAY TOPOGRAPHY ELECTRON-MICROSCOPY OBSERVATIONS

被引：0

作者：

ARMIGLIATO, A ^{[1
]}

SERVIDORI, M ^{[1
]}

机构：

[1] CNR, LAMEL, VIA CASTAGNOLI 1, 40126 BOLOGNA, ITALY

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1974年 / 25卷 / 01期

关键词：

D O I：

10.1002/pssa.2210250136

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K1 / +

页数：1

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