LOW-NOISE MICROWAVE HIFET FABRICATED USING PHOTOLITHOGRAPHY AND MOCVD

被引:9
作者
TANAKA, K
TAKAKUWA, H
NAKAMURA, F
MORI, Y
KATO, Y
机构
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D O I
10.1049/el:19860331
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:487 / 488
页数:2
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共 5 条
[1]  
JOSHIN K, 1984, 16TH C SOL STAT DEV, P347
[2]   ULTRA LOW-NOISE AND HIGH-FREQUENCY OPERATION OF TEGFETS MADE BY MBE [J].
LAVIRON, M ;
DELAGEBEAUDEUF, D ;
ROCHETTE, JF ;
JAY, PR ;
DELESCLUSE, P ;
CHEVRIER, J ;
LINH, NT .
PHYSICA B & C, 1985, 129 (1-3) :376-379
[3]   MICROWAVE PERFORMANCE OF 0.25-MU-M GATE LENGTH HIGH ELECTRON-MOBILITY TRANSISTORS [J].
MISHRA, UK ;
PALMATEER, SC ;
CHAO, PC ;
SMITH, PM ;
HWANG, JCM .
IEEE ELECTRON DEVICE LETTERS, 1985, 6 (03) :142-145
[4]  
SHIBATA K, 1985, JUN IEEE MTT S, P547
[5]   LOW-NOISE HEMT FABRICATED BY MOCVD [J].
TAKAKUWA, H ;
KATO, Y ;
WATANABE, S ;
MORI, Y .
ELECTRONICS LETTERS, 1985, 21 (04) :125-126