FAULT-DETECTION AND CLASSIFICATION IN LINEAR INTEGRATED-CIRCUITS - AN APPLICATION OF DISCRIMINATION ANALYSIS AND HYPOTHESIS-TESTING

被引：39
作者：
EPSTEIN, BR
CZIGLER, M
MILLER, SR
机构：
[1] DAVID SARNOFF RES CTR TECH STAFF,PRINCETON,NJ 08543
[2] DAVID SARNOFF RES CTR,ADV SIGNAL PROC RES GRP,PRINCETON,NJ
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1993年 / 12卷 / 01期
关键词：
D O I：
10.1109/43.184847
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The standard multivariate techniques of hypothesis testing and discrimination analysis have been applied to detect and classify faults in a variety of linear IC designs. These techniques are potentially useful for tracking IC failures during processing or for assessing failure mechanisms of IC's once the circuits are in field use. Our results indicate that the statistical methods investigated potentially yield low detection and classification error rates.
引用
收藏
页码：102 / 113
页数：12
相关论文
共 21 条
[1]  
ANTONGETTI P, 1988, SEMICONDUCTOR MODELI
[2]  
APFELBAUM L, 1986, 1986 P INT TEST C, P947
[3]  
AQUARLES TL, 1989, UCBERLMU CAL EL RES
[4]  
BANDLER JW, 1985, AUG P IEEE, V73, P1270
[5]  
ENSLEINE K, 1977, STATISTICAL METHODS, V3
[6]  
EPSTEIN BR, 1991, 1991 IEEE VLSI TEST
[7]  
EPSTEIN BR, 1990, LINEAR MICROCIRCUIT
[8]  
EPSTEIN BR, 1991, LINEAR MICROCIRCUIT
[9]   A CMOS FAULT EXTRACTOR FOR INDUCTIVE FAULT ANALYSIS [J].
FERGUSON, FJ ;
SHEN, JP .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1988, 7 (11) :1181-1194
[10]  
HOCHWALD W, DC APPROACH ANALOG F, P523
123