CHARGE EMISSION FROM INTERFACE STATES AT SILICON GRAIN-BOUNDARIES BY THERMAL EMISSION AND THERMIONIC-FIELD EMISSION .2. EXPERIMENT

被引：8
|
作者：
DEGROOT, AW [1 ]
CARD, HC [1 ]
机构：
[1] UNIV MANITOBA,DEPT ELECT ENGN,MAT & DEVICES RES LAB,WINNIPEG R3T 2N2,MANITOBA,CANADA
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1984年 / 31卷 / 10期
关键词：
D O I：
10.1109/T-ED.1984.21718
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1370 / 1376
页数：7
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