MOSFET THRESHOLD EXTRACTION CIRCUIT

被引:10
作者
MANARESI, N
FRANCHI, E
GNUDI, A
BACCARANI, G
机构
[1] DEIS, Universitá di Bologna, BO, Viale Risorgimento 2
关键词
ANALOG INTEGRATED CIRCUITS; MOSFETS; SEMICONDUCTOR DEVICE CHARACTERIZATION;
D O I
10.1049/el:19950990
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel method for the extraction of MOST threshold voltage (V-T) is presented. It is based on a self-biasing loop and it allows an output voltage equal to the V-T of either n-MOS or p-MOS transistors to be obtained without any restriction on the particular type of well.
引用
收藏
页码:1434 / 1435
页数:2
相关论文
共 3 条
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WANG, ZH .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1991, 26 (09) :1293-1301
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WANG, ZH .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1992, 27 (09) :1277-1285