共 3 条
MOSFET THRESHOLD EXTRACTION CIRCUIT
被引:10
作者:
MANARESI, N
FRANCHI, E
GNUDI, A
BACCARANI, G
机构:
[1] DEIS, Universitá di Bologna, BO, Viale Risorgimento 2
关键词:
ANALOG INTEGRATED CIRCUITS;
MOSFETS;
SEMICONDUCTOR DEVICE CHARACTERIZATION;
D O I:
10.1049/el:19950990
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
A novel method for the extraction of MOST threshold voltage (V-T) is presented. It is based on a self-biasing loop and it allows an output voltage equal to the V-T of either n-MOS or p-MOS transistors to be obtained without any restriction on the particular type of well.
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页码:1434 / 1435
页数:2
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