CORRELATION BETWEEN MOST 1/F NOISE AND CCD TRANSFER INEFFICIENCY

被引：36

作者：

VANDAMME, LKJ ^{[1
]}

DEVRIES, RGMP ^{[1
]}

机构：

[1] TWENTE UNIV TECHNOL,7500 AE ENSCHEDE,NETHERLANDS

来源：

SOLID-STATE ELECTRONICS | 1985年 / 28卷 / 10期

关键词：

D O I：

10.1016/0038-1101(85)90038-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1049 / 1056

页数：8

共 25 条

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