TEMPERATURE-DEPENDENCE OF THE CRITICAL ELECTRON EXPOSURE FOR HYDROCARBON MONOLAYERS

被引：12

作者：

DOWNING, KH

机构：

来源：

ULTRAMICROSCOPY | 1983年 / 11卷 / 04期

关键词：

D O I：

10.1016/0304-3991(83)90003-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：229 / 237

页数：9

共 28 条

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