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- [5] OBSERVATION OF CRYSTALLINE DEFECTS IN SCANNING ELECTRON-MICROSCOPY JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : 519 - 520
- [6] OBSERVATION OF CRYSTAL DEFECTS IN SCANNING ELECTRON-MICROSCOPY JOURNAL DE PHYSIQUE LETTRES, 1976, 37 (11): : L309 - L312
- [10] OBSERVATION OF THE DEFECTS IN SEMICONDUCTORS BY PULSED SCANNING ELECTRON-MICROSCOPY JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1981, 6 (01): : 39 - 53