CHARACTERIZATION OF SINGLE-CRYSTALS OF HIGH-TC SUPERCONDUCTOR LA2-XSRXCUO4

被引：3
作者：
AOMINE, N [1 ]
YAMADA, H [1 ]
SOEJIMA, Y [1 ]
OKAZAKI, A [1 ]
TANAKA, I [1 ]
KOJIMA, H [1 ]
机构：
[1] YAMANASHI UNIV,INST INORGAN SYNTH,KOFU,YAMANASHI 400,JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 11A期
关键词：
CRYSTAL GROWTH; HIGH-TC SUPERCONDUCTOR; X-RAY DIFFRACTION; HIGH RESOLUTION; CHARACTERIZATION; LATTICE CONSTANT;
D O I：
10.1143/JJAP.32.4959
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
High-angle double-crystal X-ray diffractometry (HADOX) has been applied to examine the quality of La2-xSrxCuO4 crystals grown by the travelling-solvent floating-zone method. The two-dimensional intensity distribution in reciprocal space is measured for 0014 and 400 with CoKalpha1 radiation in a temperature range 60-260 K. The temperature dependence of the lattice constants is also measured. It is found that the crystal consists of grains or regions with different chemical compositions (DELTAx congruent-to 0.01), and that the corresponding crystallographic axes in different grains are parallel. A tetragonal-to-orthorhombic phase transition is reflected in changes in the crystal orientation, peak splittings and lattice constants as functions of temperature.
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收藏
页码：4959 / 4965
页数：7
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