THICKNESS DEPENDENCE OF THE SPIN-RESOLVED AND ANGLE-RESOLVED PHOTOEMISSION OF ULTRATHIN, EPITAXIAL NI(111)/W(110) LAYERS

被引：17
|
作者：
KAMPER, KP
SCHMITT, W
WESNER, DA
GUNTHERODT, G
机构：
来源：
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1989年 / 49卷 / 06期
关键词：
D O I：
10.1007/BF00616982
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：573 / 578
页数：6
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