DETERMINATION OF X-RAY PHOTOEMISSION LINE-SHAPE ASYMMETRIES FROM THRESHOLD EXPONENTS

被引：17

作者：

DOW, JD

FRANCESCHETTI, DR

机构：

[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

[2] UNIV ILLINOIS,DEPT PHYS,URBANA,IL 61801

来源：

PHYSICAL REVIEW LETTERS | 1975年 / 34卷 / 21期

关键词：

D O I：

10.1103/PhysRevLett.34.1320

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1320 / 1323

页数：4

共 29 条

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[4]

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[5] X-RAY-SPECTRA OF ALUMINUM [J].

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[6] K-EDGE X-RAY-SPECTRA OF MG AND OTHER SIMPLE METALS - ABSENCE OF EVIDENCE FOR ORTHOGONALITY CATASTROPHES [J].

DOW, JD .

PHYSICAL REVIEW B, 1974, 9 (10) :4165-4170

[7]

DOW JD, 1974, J PHYS F MET PHYS, V4, pL76, DOI 10.1088/0305-4608/4/4/002

[8] X-RAY-SPECTRA OF METALLIC ALLOYS - MANY-ELECTRON EFFECTS [J].

DOW, JD ;

SMITH, DL .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1973, 3 (09) :L170-L172

[9] COMPATIBILITY RELATIONSHIPS FOR X-RAY THRESHOLD SHAPES [J].

DOW, JD .

PHYSICAL REVIEW LETTERS, 1973, 31 (18) :1132-1135

[10] X-RAY EDGES OF SIMPLE METALS - DEPENDENCE ON ELECTRON-DENSITY [J].

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PHYSICAL REVIEW LETTERS, 1973, 31 (24) :1461-1463

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