DETERMINATION OF MODE-CUTOFF WAVELENGTHS AND REFRACTIVE-INDEX PROFILE OF PLANAR OPTICAL WAVE-GUIDES WITH A PHOTON SCANNING TUNNELING MICROSCOPE

被引：10

作者：

BOURILLOT, E ^{[1
]}

HOSAIN, SI ^{[1
]}

GOUDONNET, JP ^{[1
]}

VOIRIN, G ^{[1
]}

KOTROTSIOS, G ^{[1
]}

机构：

[1] CTR SUISSE ELECTR & MICROTECH SA,RECH & DEV,CH-2007 NEUCHATEL,SWITZERLAND

来源：

PHYSICAL REVIEW B | 1995年 / 51卷 / 16期

关键词：

D O I：

10.1103/PhysRevB.51.11225

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A method, using the photon scanning tunneling microscope, is proposed to measure the mode cutoff wavelengths of a planar optical waveguide with an arbitrary refractive index profile. From the measured values of the cutoff wavelengths, the characteristic thickness and the maximum refractive index of the guiding film are determined. Measurements, performed on a planar waveguide with a complementary error function profile, are in reasonably good agreement with the theoretical calculations. © 1995 The American Physical Society.

引用

页码：11225 / 11228

页数：4

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