SOME ASPECTS OF LIQUID-METAL ION SOURCES

[1] AITKEN KL, 1976, P FIELD EMISSION DAY, P23

[2] LMIS ENERGY BROADENING INTERPRETATION SUPPORTED BY HV-TEM OBSERVATIONS [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 223 - 226

[3] INTENSE FIELD-EMISSION ION-SOURCE OF LIQUID-METALS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1208 - 1208

[4] Cleaver J. R. A., 1973, Scanning Electron Microscopy 1973, P49

[5] ELECTRON GUN USING A FIELD EMISSION SOURCE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) : 576 - &

[6] ELGOMATI MM, 1985, J PHYS E SCI INSTRUM, V18, P32, DOI 10.1088/0022-3735/18/1/011

[7] ELGOMATI MM, 1983, THESIS U YORK

[8] GENERALIZED THEORY OF STANDARD FIELD-ION APPEARANCE ENERGIES [J]. SURFACE SCIENCE, 1976, 61 (01) : 221 - 240

[9] GAUBI H, 1982, 29TH P INT FIELD EM, P357

[10] ANALYSIS OF ENERGY BROADENING IN CHARGED-PARTICLE BEAMS [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 167 - 172

[1] AITKEN KL, 1976, P FIELD EMISSION DAY, P23

[2] LMIS ENERGY BROADENING INTERPRETATION SUPPORTED BY HV-TEM OBSERVATIONS [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 223 - 226

[3] INTENSE FIELD-EMISSION ION-SOURCE OF LIQUID-METALS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1208 - 1208

[4] Cleaver J. R. A., 1973, Scanning Electron Microscopy 1973, P49

[5] ELECTRON GUN USING A FIELD EMISSION SOURCE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) : 576 - &

[6] ELGOMATI MM, 1985, J PHYS E SCI INSTRUM, V18, P32, DOI 10.1088/0022-3735/18/1/011

[7] ELGOMATI MM, 1983, THESIS U YORK

[8] GENERALIZED THEORY OF STANDARD FIELD-ION APPEARANCE ENERGIES [J]. SURFACE SCIENCE, 1976, 61 (01) : 221 - 240

[9] GAUBI H, 1982, 29TH P INT FIELD EM, P357

[10] ANALYSIS OF ENERGY BROADENING IN CHARGED-PARTICLE BEAMS [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 167 - 172