MEASUREMENTS OF X-RAY SPECTRAL FLUX OF HIGH-BRIGHTNESS UNDULATORS BY GAS SCATTERING

被引：5
作者：
ILINSKI, P
YUN, W
LAI, B
GLUSKIN, E
CAI, Z
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 02期
关键词：
D O I：
10.1063/1.1145820
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Absolute radiation flux and polarization measurements of the Advanced Photon Source (APS) undulators may have to be made under high thermal loading conditions. A method that may circumvent the high-heat-load problem was tested during a recent APS/CHESS undulator run. The technique makes use of a Si(Li) energy-dispersive detector to measure 5-35 keV x rays scattered from a well-defined He gas volume at controlled pressure. © 1995 American Institute of Physics.
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页码：1907 / 1909
页数：3
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