DEFECT OBSERVATIONS OF GAAS-ALXGA1-XAS HETEROSTRUCTURES BY TRANSMISSION INFRARED MICROSCOPY

被引：1

作者：

KAWAKAMI, T ^{[1
]}

SAITO, H ^{[1
]}

机构：

[1] MUSASHINO ELECT COMMUN LAB,TOKYO,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1975年 / 14卷 / 12期

关键词：

D O I：

10.1143/JJAP.14.2073

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2073 / 2074

页数：2

共 8 条

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[8] GAAS-ALXGA1-XAS DOUBLE HETEROSTRUCTURE PLANAR STRIPE LASER [J].

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