OBSERVATION OF SURFACE CORRUGATION OF HIGHLY ORIENTED PYROLYTIC-GRAPHITE BY SCANNING TUNNELING MICROSCOPE IN AIR

被引：9
作者：
IRI, T
SHIBA, H
NISHIKAWA, H
机构：
[1] The University of Electro-Communications, Chofu-shi, Tokyo
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1992年 / 31卷 / 5A期
关键词：
STM; HOPG SURFACE; AIR; ATOMIC CORRUGATION;
D O I：
10.1143/JJAP.31.1441
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The apparent surface corrugation of highly oriented pyrolytic graphite (HOPG) was investigated with a scanning tunneling microscope (STM) in air using mechanically polished PtIr tips. It was found that the tunneling resistance was the most dominant parameter governing the observed atomic corrugation. The tunneling resistance was defined by the ratio of bias voltage to tunneling current required for STM measurements. The maximum corrugation of about 0.3 nm was attained at the tunneling resistance around 10(7) OMEGA. The dependence of the corrugation upon tunneling resistance is qualitatively explained taking into account the variation of tip function, by means of both the elastic deformation of the sample surface and the separation change of the tip and surface.
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页码：1441 / 1445
页数：5
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