CONVERGENT-BEAM REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) OBSERVATIONS FROM AN SI(111) SURFACE

被引：76

作者：

LEHMPFUHL, G ^{[1
]}

DOWELL, WCT ^{[1
]}

机构：

[1] CSIRO,DIV CHEM PHYS,CLAYTON,VIC 3168,AUSTRALIA

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1986年 / 42卷

关键词：

D O I：

10.1107/S0108767386098720

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：569 / 577

页数：9

共 16 条

[1]

DOWELL WCT, 1980, MICRON S1, V11, P45

[2] OBSERVATION OF BACKGROUND CONTRAST IN CONVERGENT BEAM PATTERNS [J].

GOODMAN, P .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1972, A 28 (JAN1) :92-&

[3]

HOJLUNDNIELSEN PE, 1976, SURF SCI, V54, P340

[4] REFLECTION ELECTRON-MICROSCOPY (REM) OF FCC METALS [J].

HSU, T ;

COWLEY, JM .

ULTRAMICROSCOPY, 1983, 11 (04) :239-250

[5] OBSERVATION OF THE SURFACE-STATE RESONANCE EFFECT BY THE CONVERGENT BEAM RHEED TECHNIQUE [J].

ICHIMIYA, A ;

KAMBE, K ;

LEHMPFUHL, G .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1980, 49 (02) :684-688

[6]

KOHRA K, 1962, J PHYS SOC JPN, V17, P82

[7] PHOTOGRAPHICAL RECORD OF DISPERSION SURFACE IN ROTATING CRYSTAL ELECTRON DIFFRACTION PATTERN [J].

LEHMPFUHL, G ;

REISSLAND, A .

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1968, A 23 (04) :544-+

[8]

LEHMPFUHL G, 1986, P ELECTRON MICROSC S, P376

[9] RESONANCE EFFECTS IN RHEED FROM PT(111) [J].

MARTEN, H ;

MEYEREHMSEN, G .

SURFACE SCIENCE, 1985, 151 (2-3) :570-584

[10] REFLECTION ELECTRON-MICROSCOPY OF CLEAN AND GOLD DEPOSITED (111) SILICON SURFACES [J].

OSAKABE, N ;

TANISHIRO, Y ;

YAGI, K ;

HONJO, G .

SURFACE SCIENCE, 1980, 97 (2-3) :393-408

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