HOMOGENEITY TESTING BY PHASE SAMPLING INTERFEROMETRY

被引：40

作者：

SCHWIDER, J

BUROW, R

ELSSNER, KE

SPOLACZYK, R

GRZANNA, J

机构：

来源：

APPLIED OPTICS | 1985年 / 24卷 / 18期

关键词：

D O I：

10.1364/AO.24.003059

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3059 / 3061

页数：3

共 10 条

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[7] DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES [J].

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[10]

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