TECHNOLOGICAL APPLICATIONS OF SCANNING TUNNELING MICROSCOPY AT ATMOSPHERIC-PRESSURE

被引:49
作者
MIRANDA, R
GARCIA, N
BARO, AM
GARCIA, R
PENA, JL
ROHRER, H
机构
[1] IPN,CTR INVEST ESTUDIOS AVANZADOS,SECC METROL,E-14740 MEXICO,DF,MEXICO
[2] IBM CORP,ZURICH RES LAB,RUSCHLIKON,SWITZERLAND
关键词
D O I
10.1063/1.96167
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:367 / 369
页数:3
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