APPLICATION OF SYNCHROTRON RADIATION TO ELEMENTAL ANALYSIS

被引：34

作者：

JONES, KW ^{[1
]}

GORDON, BM ^{[1
]}

HANSON, AL ^{[1
]}

HASTINGS, JB ^{[1
]}

HOWELLS, MR ^{[1
]}

KRANER, HW ^{[1
]}

CHEN, JR ^{[1
]}

机构：

[1] SUNY COLL GENESEO, COLL ARTS & SCI, GENESEO, NY 14454 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1984年 / 3卷 / 1-3期

关键词：

D O I：

10.1016/0168-583X(84)90367-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：225 / 231

页数：7

共 18 条

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[4] EVIDENCE FOR PRIMORDIAL SUPERHEAVY ELEMENTS [J].

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[6]

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[7] SENSITIVITY CALCULATIONS FOR MULTIELEMENTAL TRACE ANALYSIS BY SYNCHROTRON RADIATION-INDUCED X-RAY-FLUORESCENCE [J].

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[8]

GREEN GK, 1977, BNL50595, V2

[9] TRACE-ELEMENT MEASUREMENTS WITH SYNCHROTRON RADIATION [J].

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[10]

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