HIGH-RESOLUTION FREQUENCY-DOMAIN REFLECTOMETRY

被引：30
作者：
VANHAMME, H
机构：
[1] Department ELEC, Vrije Universiteit Brussel
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1990年 / 39卷 / 02期
关键词：
D O I：
10.1109/19.52517
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A high resolution method for the estimation of the position and magnitude of reflections from frequency-domain measurements is presented. The technique can tackle problems where Fourier transform-based analysis fails. The connection between high resolution frequency-domain reflectometry (FDR) and the estimation of the parameters of complex sinusoids with known phase is shown. A suitable algorithm is outlined and its performance is evaluated analytically and through simulation. To demonstrate its practical applicability, the proposed method is tested on vector network analyzer (VNA) measurements of a coaxial transmission line with a nonuniform dielectric. © 1990 IEEE
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页码：369 / 375
页数：7
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