LOW-VOLTAGE SEM - PROSPECTS AND LIMITS IN BIOLOGICAL-RESEARCH

被引:0
|
作者
PESCHKE, T
机构
关键词
D O I
暂无
中图分类号
Q2 [细胞生物学];
学科分类号
071009 ; 090102 ;
摘要
Low voltage SEM shows, in general, topographic and compositional contrast of nonconducting beam-sensitive specimens by secondary electrons without coating. But until now imaging of small surface features rich in contrast requires metal-coating.
引用
收藏
页码:451 / 452
页数:2
相关论文
共 50 条
  • [1] THE PROMISE OF LOW-VOLTAGE SEM
    PAWLEY, J
    SCANNING, 1988, 10 (01) : 1 - 1
  • [2] Topography contrast in low-voltage SEM
    Libinson, AG
    ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION, 1998, : 475 - 476
  • [3] CONTROL OF CHARGING IN LOW-VOLTAGE SEM
    JOY, DC
    SCANNING, 1989, 11 (01) : 1 - 4
  • [4] Micrograph contrast in low-voltage SEM and cryo-SEM
    Liberman, Lucy
    Kleinerman, Olga
    Davidovich, Irina
    Talmon, Yeshayahu
    ULTRAMICROSCOPY, 2020, 218
  • [5] Analysis of low-voltage SEM collection efficiency
    Melnikov A.A.
    Potapkin O.D.
    Bulletin of the Russian Academy of Sciences: Physics, 2010, 74 (07) : 1011 - 1014
  • [6] Design of an aberration corrected low-voltage SEM
    van Aken, R. H.
    Maas, D. J.
    Hagen, C. W.
    Barth, J. E.
    Kruit, P.
    ULTRAMICROSCOPY, 2010, 110 (11) : 1411 - 1419
  • [7] Simplified aberration corrector for low-voltage SEM
    Mentink, SAM
    Steffen, T
    Tiemeijer, PC
    Krijn, MPCM
    ELECTRON MICROSCOPY AND ANALYSIS 1999, 1999, (161): : 83 - 86
  • [8] HIGH-RESOLUTION MICROSCOPY WITH A LOW-VOLTAGE SEM
    WATANABE, T
    YAMADA, M
    SUZUKI, T
    NAKAIZUMI, Y
    NAGATANI, T
    JOURNAL OF ELECTRON MICROSCOPY, 1985, 34 (03): : 215 - 215
  • [9] ABERRATION CORRECTION IN A LOW-VOLTAGE SEM BY A MULTIPOLE CORRECTOR
    ZACH, JC
    HAIDER, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1995, 363 (1-2) : 316 - 325
  • [10] CORRECTION OF SPHERICAL AND CHROMATIC ABERRATION IN A LOW-VOLTAGE SEM
    ZACH, J
    HAIDER, M
    OPTIK, 1995, 98 (03): : 112 - 118