THE IMPORTANCE OF BEAM ALIGNMENT AND CRYSTAL TILT IN HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：142
作者：
SMITH, DJ
SAXTON, WO
OKEEFE, MA
WOOD, GJ
STOBBS, WM
机构：
来源：
ULTRAMICROSCOPY | 1983年 / 11卷 / 04期
关键词：
D O I：
10.1016/0304-3991(83)90006-2
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：263 / 281
页数：19
相关论文
共 30 条
[1]   ONLINE IMAGE-PROCESSING IN HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].
BOYES, ED ;
MUGGRIDGE, BJ ;
GORINGE, MJ .
JOURNAL OF MICROSCOPY-OXFORD, 1982, 127 (SEP) :321-335
[2]   MEASUREMENT OF FOCUS AND SPHERICAL-ABERRATION OF AN ELECTRON-MICROSCOPE OBJECTIVE LENS [J].
BUDINGER, TF ;
GLAESER, RM .
ULTRAMICROSCOPY, 1976, 2 (01) :31-41
[3]  
CATTO CJD, 1982, INST PHYS CONF SER, P123
[4]   ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS [J].
COWLEY, JM ;
IIJMA, S .
ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03) :445-+
[5]   THE ACCOMPLISHMENTS AND PROSPECTS OF HIGH-RESOLUTION IMAGING METHODS [J].
COWLEY, JM .
ULTRAMICROSCOPY, 1982, 8 (1-2) :1-12
[6]   NUMERICAL EVALUATION OF N-BEAM WAVE-FUNCTIONS IN ELECTRON-SCATTERING BY MULTI-SLICE METHOD [J].
GOODMAN, P ;
MOODIE, AF .
ACTA CRYSTALLOGRAPHICA SECTION A, 1974, A 30 (MAR) :280-290
[7]   THE ELECTRON OPTICAL SYSTEM OF THE ELECTRON MICROSCOPE [J].
HAINE, ME .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1947, 24 (03) :61-66
[8]   UNITS AND CONVENTIONS IN ELECTRON-MICROSCOPY, FOR USE IN ULTRAMICROSCOPY [J].
HAWKES, PW .
ULTRAMICROSCOPY, 1980, 5 (01) :67-70
[9]  
HEINEMANN K, 1971, OPTIK, V34, P113
[10]   HIGH-RESOLUTION ELECTRON MICROSCOPY OF CRYSTAL LATTICE OF TITANIUM-NIOBIUM OXIDE [J].
IIJIMA, S .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) :5891-+
123